NI PXIE-4145 | Precision PXI source measurement unit

The name NI PXIe-4145 is Precision PXI Source Measurement Unit

· Number of channels: It has 4 channels and can measure and control multiple tested devices simultaneously.

· Measurement range: The voltage measurement range of each channel is usually ± 6V, and the current measurement range can reach 500mA, which can meet the 

measurement needs of various types and specifications of tested devices.

· Sampling rate: A high sampling rate helps to shorten the measurement time, quickly capture the transient characteristics of the device, and perform fast IV characteristic 

analysis on the tested device.

· Operation mode: Adopting a four quadrant operation mode, flexible measurement and control can be achieved under different working conditions, adapting to various 

types of tested devices and testing scenarios.

· Sensing function: Each channel integrates remote (4-wire) sensing function, which can effectively reduce measurement errors and improve measurement accuracy and 

precision.

· Synchronization function: With the help of a high-speed sequence engine, synchronization between these source measurement units or with other instruments can be 

achieved, ensuring collaborative work between various parts in multi-channel or multi instrument measurement systems, and improving the measurement accuracy and 

reliability of the entire system.

· Technical features: Equipped with SourceAdapt technology, PXIe-4145 can adjust its response to any load to achieve optimal response, maximize stability, and reduce 

transient characteristics.

· Semiconductor testing: In the research and development, production, and quality inspection process of semiconductor devices, it can be used to perform IV characteristic 

testing, reliability testing, fault diagnosis, etc. on semiconductor chips, transistors, diodes, and other devices, helping engineers quickly and accurately evaluate the 

performance and quality of semiconductor devices.

· Power electronics testing: For power electronic devices such as power amplifiers, power modules, and power MOSFETs, their voltage, current, power, and other parameters 

can be measured under different working conditions to evaluate their efficiency, linearity, stability, and other performance indicators, providing a basis for the design and 

optimization of power electronic devices.

· Battery testing: It can be used for charge and discharge testing, capacity testing, internal resistance testing, cycle life testing, etc. of various batteries, such as lithium-ion 

batteries, nickel hydrogen batteries, lead-acid batteries, etc., to help researchers and manufacturers understand the performance and life of batteries, optimize battery 

design and production processes.

· Electronic component testing: It can measure the parameters and evaluate the performance of passive components such as resistors, capacitors, inductors, as well as active 

components such as operational amplifiers, comparators, and filters, to ensure the quality and reliability of electronic components and provide accurate component 

parameters for the design and assembly of electronic circuits.

· Material property research: In materials science research, it can be used to measure the electrical properties of materials, such as resistivity, conductivity, dielectric constant, 

etc., to study the changes in electrical properties of materials under different conditions, and provide data support for the development and application of new materials.